• 3D microscopy at different length-scales, including X-ray tomography, 3D-SEM, 3D-EDS and 3D-EBSD in the FIB and
3D-TEM and 3D-EDS in the TEM.
• In-situ mechanical testing of mininaturised samples in the X-ray tomography system as well as in the SEM and TEM.
• In-situ processing studies in the X-ray tomography system, such as casting, infiltration and curing of polymer based
materials.
• Raman spectrophotometer.
Location
C/ Eric Kandel, 2
Tecnogetafe
28906, Getafe, Madrid (Spain)
