External use of X-Ray Tomograph PHOENIX

GE (Phoenix) Nanotom 160 kV with a Hamamatsu 7942-25SK detector (2K x 2K) and tungsten and molybdenum targets, with a nanofocus X-ray source. This equipment is capable of both radiography (RX) and computed tomography (XCT) modes.
Attainable resolution varies between <1 µm/px and 30 µm/px, depending on sample size and composition. The field of view (FOV) varies according to the required resolution and the detector can be virtually expanded up to three times.
Equipment can scan a broad range of materials, for example:

• Biological tissues
• Geological samples
• Alloys (lithium, magnesium, titanium, aluminum, nickel, cobalt, steel…)
• Composite materials
  • Metallic matrix
  • Polymer matrix (glass fiber, carbon fiber, hybrid…)
  • Ceramic

Example applications:

• Geometrical analysis
• Damage
• Defects
• Porosity
• Interconnectivity
• Orientation of features
• 3D distribution (defects, damage, phases, etc.)

You can also check the following link:

http://www.materials.imdea.org/groups/nano/research-lines/x-ray-tomography/

Other available services:

• Analysis of scanned data (Avizo, VGStudio Max, in-house developed software)
• In-situ:
  • Mechanical testing:
    • Tension
    • Compression
    • Low-cycle fatigue
    • Application of temperature (in-situ furnace)
  • For other in-situ application, please contact us

CONTACT:

Dr. Javier García (javier.garcia@imdea.org)

RATES: