External use of FEI Helios NanoLab 600i FIB-FEGSEM

EQUIPMENT DESCRIPTION:

FEI (now Thermo Fisher Scientific) Helios NanoLab 600i Focused Ion Beam–Field Emission Scanning Electron Microscope (FIB-FEGSEM).

The system is designed for the characterisation and modification of materials at the micro- and nanoscale. It combines a high-resolution field emission scanning electron microscope (FEGSEM) column with a gallium focused ion beam (FIB) column, enabling high-quality imaging and precision micromachining to be performed on the same sample without the need to transfer it to another instrument.

The FEGSEM column provides high-resolution imaging using secondary electron and backscattered electron detectors, allowing detailed examination of material morphology, surface topography and compositional contrast. The FIB column enables precision milling, cross-sectioning and localised material deposition through a gas injection system (GIS). These capabilities make the instrument an essential tool for research in materials science, nanotechnology, microelectronics, biomaterials and failure analysis.

Electron beam resolution (ideal specimen, optimal working distance):

High Vacuum, Field-Free mode High Vacuum, Immersion Mode Low Vacuum, Field-Free mode
15 kV   1.0 nm 15 kV   0.7 nm 15 kV   1.2 nm
1 kV     0.9 nm 1 kV     1.0 nm 3 kV     1.8 nm

Detectors available:

  High Vacuum Mode Low Vacuum Mode
Secondary electrons ETD (Detector Everhart-Thornley)
T2 & T3 (in-lens)		 LVD (Low Vacuum Detector)
Backscattered electrons BS & ABS (retráctil)
T1 (in-lens)		 CBS & ABS (Retractable)
GAD-CBS/ABS

CONTACT: 

Dr. Manuel Avella (manuel.avella@imdea.org)

PRICES: 

The external service rates for the Helios NanoLab 600i FIB-FEGSEM are provided below. The rates shown correspond to the hourly charge for use of the instrument.

The stated price is subject to the applicable VAT in force at the time.


EQUIPMENT ORGANISMOS PÚBLICOS DE INVESTIGACIÓN (OPIS)  EMPRESAS

FEI Helios NanoLab 600i FIB-FEGSEM

 150,00 €

225,00 €