External use of ZEISS EVO MA15 SEM

EQUIPMENT DESCRIPTION
ZEISS EVO MA15 Scanning Electron Microscope (SEM)
The system is designed for materials characterisation and microstructural analysis. It belongs to the ZEISS EVO family and is equipped with an ELECTRON SOURCE electron source. It features a large specimen chamber with a motorised five-axis stage, enabling the analysis of samples of various sizes and geometries. One of its main advantages is its ability to operate in both high-vacuum and variable-pressure (VP/ESEM) modes, allowing the examination of non-conductive or slightly moist materials without the need for prior conductive coating.The ZEISS EVO MA15 is equipped with secondary electron (SE) and backscattered electron (BSE) detectors, providing detailed information on surface topography and compositional contrast. Thanks to its versatility, the instrument is widely used in fields such as materials science and engineering, geology, metallurgy, biology, forensic science, and microelectronics.Electron beam resolution (ideal specimen, optimal working distance):

 

High Vacuum, Field-Free ModeHigh Vacuum, Immersion ModeLow Vacuum, Field Free Mode
15 kV   1.0 nm15 kV   0.7 nm15 kV   1.2 nm
1 kV     0.9 nm1 kV     1.0 nm3 kV     1.8 nm

Available detectors:

 High Vacuum ModeLow Vacuum Mode
Secondary electronsETD (Everhart-Thornley Detector)
T2 & T3 (in-lens)		LVD (Low Vacuum Detector)
Backscattered electronsBS & ABS (retractable)
T1 (in-lens)		CBS & ABS (Retractable)
GAD-CBS/ABS

CONTACT: 

Dr. Manuel Avella (manuel.avella@imdea.org)

PRICES: 

The external service rates for the ZEISS EVO MA15 Scanning Electron Microscope (SEM) are provided below. The rates shown correspond to the hourly charge for use of the instrument.

The stated price is subject to the applicable VAT in force at the time.

EQUIPMENTPUBLIC RESEARCH ORGANISATIONS (PROs) COMPANIES
ZEISS EVO MA15 Scanning Electron Microscope50,00 €75,00 €