External use of ZEISS EVO MA15 SEM

DESCRIPTION OF THE EQUIPMENT
Scanning Electron Microscope (SEM) ZEISS EVO MA15.
 

Tungsten (W) electron source scanning electron microscope that generates signals, including secondary electrons and backscattered electrons, enabling high-resolution imaging and compositional contrast.

Motorized 5-axis stage: Rotation: 360°; Tilt: 0–70°

Available detectors:

  • Secondary electron detector (SE)
  • Backscattered electron detector (BSE)
  • EDS microanalysis system – Oxford INCA x-act

Main operating parameters

Acceleration voltage

Resolution

0.2 – 30 kV

~3–5 nm @ 30 kV

Typical applications

  • Microscopic characterization of materials: metals, biological materials, polymers, etc.
  • Failure analysis, fractography, etc.
  • Industrial quality control and forensic studies

 

SERVICES:

  • Topographic imaging (SE) and compositional contrast (BSE)
  • Elemental analysis by EDS, if equipped
  • In situ testing capabilities: tensile testing and nanoindentation

 

CONTACT:

Dr. Manuel Avella (manuel.avella@imdea.org)

PRICES:

The following table lists the rates for external services related to the ZEISS EVO MA15 equipment. The rates listed correspond to the hourly charge for use of the equipment.

 

EQUIPMENT PUBLIC RESEARCH ORGANIZATIONSCOMPANIES
ZEISS EVO MA1550,00 €75,00 €
 
 
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