A nanoindenter stage to carry out mechanical tests inside a Scanning Electron Microscope (SEM) for the in-situ observation of the deformation mechanisms is now available at IMDEA Materials Institute. This system (PI 87 SEM PicoIndenter, Hysitron) allows the simultaneous acquisition of the load-displacement record and the SEM images during mechanical testing (nanoindentation, micro-compression, micro-bending, micro-tension) of micrometer and sub-micrometer size volumes, including elevated temperature testing.
