Dopico, Ignacio; Castrillo, Pedro; Martin-Bragado, Ignacio
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Influence of device architecture on junction leakage in low-temperature process FDSOI MOSFETs
Sklenard, Benoit; Batude, Perrine; Rafhay, Quentin; Martin-Bragado, Ignacio; Xu, Cuiqin; Previtali, Bernard; Colombeau, Benjamin; Khaja, Fareen-Adeni; Cristoloveanu, Sorin; Rivallin, Pierrette; Tavernier, Clement; Poiroux, Thierry
