A FEG S/TEM microscope is now available at IMDEA Materials Institute. The system (Talos F200X, FEI) combines outstanding high-resolution S/TEM and TEM imaging with an energy dispersive x-ray spectroscopy (EDS) integrated system fully compatible with high-resolution 3D tomography. It is also equipped with a PicoIndenterTM platform to perform nano-mechanic in-situ tests.
