An X-ray diffractometer is now available at IMDEA Materials Institute. The system (Empyrean, PANalytical) allow for phase analysis, texture, and residual stress determination, as well as reflectometry. It is equipped with a state-of-the-art X-ray platform for the analysis of powders, thin films, nanomaterials and solid samples. The device is furnished with exchangeable tubes of Cu and Cr radiation, with three sample stages (standard, reflection-transmission spinner and Chi-Phi-x-y-z), an automated sample changer, and a linear detector (PIXcel 1D).
