Multiscale Characterisation of Materials and Processes

Goal and Vision

Progress in the development of new materials and processing methods can only come from a thorough understanding of the microstructure of the material in focus, its evolution during either processing or service operation, and its influence on the relevant properties for the purpose it was designed. Since the microstructural features that determine material behaviour usually span several length scales for instance, from macroscopic defect distribution to nanometre scale precipitates in the case of metallic alloys, this understanding can only come from advanced 4D characterisation techniques, capable of determining the evolution of the 3D microstructure over time at different length scales; hence the term 4D. This is precisely the 

objective of this programme: to understand microstructure/defect distribution and evolution in advanced materials during processing and service using advanced characterisation techniques.

Main research lines

  • Multiscale characterisation with optical and electron microscopy, X-rays, atomic force microscopy, Raman spectroscopy, and ultrasonic inspection. Some of the equipment used for this is:
    • FIB-FEG-SEM, including 3D-EDS and 3D-EBSD. In-situ stages for thermomechanical testing;
    • FEG-TEM including 3D-STEM and 3D-EDS with in-situ stage for mechanical testing;
    • X-ray Tomograph (XCT) with in-situ stage for thermomechanical testing, furnaces for thermal treatments and observation of chemical reactions, in-situ composite curing, and in-situ composite infiltration.
    • Diffraction Contrast Tomography (DCT). This new technique at IMDEA Materials facilitates obtaining tomography from the diffracted beam in crystalline samples, thus revealing the 3D orientation and grain size within specimens.
    • X-ray Diffractometer (XRD) equipped for residual stresses and texture determination, reflectometry analysis, Cu and Cr radiation, linear detector, and an in-situ furnace.
    • Raman micro-spectrometer 5x, 20x, 50x, 100x microscope objectives, 532 nm Nd:YAG laser 50W and diffraction grating of 1800 I/mm, 100 nm resolution.
    • Small angle X-ray scattering and Wide-angle X-ray scattering SAXS/WAXS for the study of crystallisation in polymers, chemical composition or phase composition of a film, film texture preferred alignment of crystallites, crystallite size, and presence of film stress.
  • Characterisation of a broad range of materials e.g. biomaterials, plastics, metal matrix composites, fibre-reinforced composites, metals, nanomaterials, etc.
  • Use of large facilities such as neutron or synchrotron radiation facilities for characterisation.
  • Development of new methodologies e.g. hardware for in-situ testing and software tools for material characterisation and analysis while also applying artificial intelligence methods.
  • Correlative studies of materials, i.e. combining insights from different techniques.
  • Thermo-mechanical testing across several length scales: tension, compression, fatigue, creep, etc. in the Scanning Electron Microscope (SEM) and X-ray tomograph.
  • Properties and deformation mechanisms of small volumes by nanomechanical testing in the Scanning and Transmission Electron Microscopes (SEM & TEM): properties of metallic phases, interfaces, nanoparticles, carbon-based nanomaterials, carbon nanotubes, graphene, etc.
  • Elevated temperature nanomechanical testing.
  • 4D characterisation of processes by X-ray tomography and X-ray diffraction: eg. metallic alloy solidification, metallic alloy phase formation and chemical reactions, infiltration and resin flow in composites, composite curing, etc.
  • Digital modelling from 3D structures.
  • Integration of experimental statistical measurements into models.
  • Experimental confirmation of modelling results.
  • Experimental design based on models.

RESEARCH GROUPS