Materials Characterisation and Processing in 3D and 4D Laboratory
The Materials Characterisation and Processing in 3D and 4D Laboratory is located at IMDEA Materials Institute and is organised into three fundamental units:
- Electron Microscopy Unit
- X-ray Tomography Unit
- Additive Manufacturing Unit
The laboratory’s service coordinator is Dr. Juan Pedro Fernández. Each of the units also has the scientific supervision of the senior researchers responsible for each of the research lines.
The Materials Characterisation and Processing in 3D and 4D Laboratory is structured as follows:
Services coordinator: Dr. Juan Pedro Fernández.
- Electron Microscopy Unit:
Technical manager: Dr. Manuel Avella.
Scientific coordinator: Dr. Jon Molina.
- X-ray Tomography Unit:
Technical manager: Dr. Javier García.
Scientific coordinator: Dr. Federico Sket.- Additive Manufacturing Unit:
Technical manager: Amalia San Román.
Scientific coordinator: Dr. Teresa Pérez Prado.
- Electron Microscopy Unit:
- Microstructure characterisation via controlled pressure scanning microscopy (SEM).
- Deformation and fracture mechanic characterisation through in-situ tests using controlled pressure scanning microscopy (SEM), and mechanical testing machines in metallic and composite materials.
- Characterisation in TEM or STEM mode and chemical analysis performance in EDS; TEM, STEM and EDS mode tomography; in-situ mechanical tests inside the TEM using the Hysitron PIcoindenter PI95 holder.
- X-ray Tomography Unit:
- Defects characterisation and internal structure by X-ray computational tomography.
- Fracture mechanism characterisation via in-situ tests using X-ray computational tomography and mechanical testing.
- Additive Manufacturing Unit
- Laser Powder Bed Fusión (LPBF) of metallic alloy samples.
Currently available equipment: Electron Microscopy Unit:
- Thermofisher Scientific Apreo 2S LoVac FEG SEM microscope, equipped with a NiCol electron column with immersion lens and beam deceleration capabilities. Everhart-Thornley Detector (ETD), in-lens Trinity Detector System (T1,T2,T3), retractable backscatter detector (CBS/ABS), low-vacuum detector (LVD) and GAD-CBS/ABS for low vacuum mode.
- FEI Talos F200X, FEG S/TEM microscope, which integrates a chemical analysis system by energy dispersive spectrometry (EDS), a CMOS digital camera to acquire images with a maximum resolution of 4×4 k, a tomography system to perform tomographies in TEM, STEM and EDS mode and a Hysitron PicoIndenter PI95 holder, to conduct in-situ nano-mechanical tests (S/TEM-Ind).
For more information about external use of TEM, click here.
For more information about external use of SEM, click here. X-ray Tomography Unit:
- GE (Phoenix) Nanotom 160 kV with a Hamamatsu 7942-25SK detector (2K x 2K) and tungsten and molybdenum targets, with a nanofocus X-ray source. This equipment is capable of both radiography (RX) and computed tomography (XCT) modes.
Zeiss Xradia 620 Versa laboratory tomograph with flat panel detector (3k × 2k pixels) and CCD camera (2k × 2k pixels) with the possibility of different objectives (0.4X, 4X, 20X, and 40X). The equipment features a focused X-ray tube with a tungsten emitter and voltage up to 160 kV. This equipment allows for the acquisition of radiographs (RX) and computed tomography (XCT), as well as the possibility of performing diffraction tomography (DCT), which can determine the size and orientation of grains in metallic materials.
For more information on external use of the X-ray Tomograph DCT Versa620, click here.
For more information on external use of the X-ray Tomograph PHOENIX, click here. Additive Manufacturing Unit:
Renishaw AM400 Laser Powder Bed Fusion (LPBF) system for the additive manufacturing of metallic materials (Inconel, Aluminum, High entropy alloys, Nitinol, Nickel) with the following specifications:
- Laser power: 400 W
- Laser thickness: 20 to 100 micrometres
- Spot size: 70 micrometres
- Speed scanning: up to 2 m/s
- Build volume: 248 mm x 248 mm x 285 mm.
- Reduced build volume option available: 55mm x 78 mm x 78 mm
In order to obtain further information on the Institute’s Materials Characterisation and Processing in 3D and 4D Laboratory services, and/or a specific technical-economic offer, send an e-mail to contact.materials@imdea.org
In the specific case of TEM and X-ray Tomography services, contact the relevant technical manager directly.
- TEM: Dr. Manuel Avella (manuel.avella@imdea.org).
- X-ray Tomography: Dr. Javier García (javier.garcia@imdea.org).
For further information and current rates for TEM services, click here.
For further information and current rates for X-ray tomography services, click here.
The rates for the rest of the services will vary depending on the characterization work required (type of material, type of tests, number of samples, test standards, etc.).
Location
C/ Eric Kandel, 2
Tecnogetafe
28906, Getafe, Madrid (España)
Telephone: (+34) 91 549 34 22
email: